 DescriptionLEXT OLS4000 - the new reference for measurement on microscopic level The new OLS4000 with its unique dual pinhole technology fulfils the requirements of any thinkable material structure. Identify your feature of interest quickly and reliable with the new GUI design, which support research and inspection processes at any step. With its outstanding accuracy and resolution while not affecting the sample itself, the new LEXT will help you to quickly discover the last unknown properties of your sample topography. The extreme fast film thickness measurement, the flexible line roughness mode and the precise color quality of the build in CCD rounds up the feature spectrum of the OLS4000. Find it more easy than ever to create professional reports and to standardize measurements according to your requirements. |
Features and Benefits
Key Features
Certified accuracy and repeatability
High resolution (down to 120nm L&S)
Outstanding slope detection capability
(up to 85°)
Fast and easy operation environment
Roughness testing according to all
standards
Advanced dual pinhole technology for
superior flexibility
The optical system designed for 405nm archieves outstanding resolution of 120nm L&S in X/Y while better than 10nm true resolution in Z in the whole field of view with the new high resolution mode and the advanced Z mode.
Slopes of more than 85°Identify topography slopes of more than 85° while being independant of material contrast. Receive reliable results with the help of the new dual pinhole technology.
State of the art objective lensesMPlan Apo LEXT - The reference in lens design. Available as 20x, 50x and 100x magnification.
Roughness as you want to qualify itIdentify roughness acording to your process needs, while staying backward compatible to any former standard.
Applications
Bare wafer manufacturers
• Measurement of laser mark depth
• Analysis of roughness of wafer surface in polishing
process
• Inspection of extraneous substances
• Measurement of taper at wafer edge
• Observation of cracks at wafer edge
Chemical materials
• Measurement of height differences of the optical
waveguides on flat panel displays
• Measurement of film thickness on the deflecting
plate for flat panal display
• Analysis of adhesive roughness
• Roughness of coating surface
• Shape of toner surface
• Analysis of metal materials after chemical treatment
Metal materials
•Analysis of corroded part
•Analysis of fracture plane
•Analysis of coating surface
•Measurement of depth of Vickers mark
•Thickness measurement of protective coatings
Automotive parts
•Surface analysis of brake pads and discs
•Analysis of sliding surface on clutch parts
•Analysis of fracture plane in piston rings.
•Surface profile of studless tires
•Surface profile of oil seal molds
•Surface profile of fuel injector
•Analysis of wear of ball bearings for steering
•Cooling fan, compressor, muffler, calibrator, etc.
•Wire and carbon materials
Other applications
•Control of SAW filter line width
•Control of LD/LED line width
•Inspection of condenser surface profile
•CD/DVD pit shape
•Surface profile of magnetic tape
•Inspection of surface profile of fiber
•Observation of ceramic particles
•Groove on pull-tab of aluminum can
•Hair
•Lipstick
•Foundation
•Teeth (artificial teeth)
•Plants
•Pearls
•Excavated historical relics
•Golf clubs and balls
•Markings on drugs
Download Brochure
Click to download brocure for LEXT OLST4000